Franklin

Testing and diagnosis of analog circuits and systems / edited by Ruey-wen Liu.

Publication:
New York, N.Y. : Van Nostrand Reinhold, c1991.
Format/Description:
Book
xiv, 284 p. : ill. ; 24 cm.
Status/Location:
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Details

Subjects:
Analog electronic systems -- Testing.
Notes:
Includes bibliographical references and index.
Contributor:
Liu, Ruey-Wen.
ISBN:
0442259328
OCLC:
22305076