Franklin

Reliability, yield, and stress burn-in : a unified approach for microelectronics systems manufacturing & software development / by Way Kuo, Wei-Ting Kary Chien, Taeho Kim.

Author/Creator:
Kuo, Way, 1951-
Publication:
Boston, Mass : Kluwer Academic Publishers, c1998.
Format/Description:
Book
xxvi, 394 p. : ill. ; 24 cm.
Subjects:
Integrated circuits -- Design and construction -- Reliability.
Microelectronics -- Reliability.
Computer software -- Development -- Reliability.
Semiconductors -- Computer programs -- Reliability.
Notes:
Includes bibliographical references (p. [333]-361) and index.
Contributor:
Chien, Wei-Ting Kary, 1965-
Kim, Taeho, 1960-
ISBN:
0792381076 (alk. paper)
OCLC:
37878683
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