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Records of the 1993 IEEE International Workshop on Memory Testing, August 9-10, 1993, San Jose, California [electronic resource]. edited by R. Rajsuman ; sponsored by IEEE Computer Society, Technical Committee on Test Technology.

Publication:
Los Alamitos, Calif. : IEEE Computer Society Press, c1993.
Format/Description:
Conference/Event
Book
ix, 143 p. : ill.
Conference Name:
IEEE International Workshop on Memory Testing (1993 : San Jose, Calif.)
Status/Location:
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Details

Other Title:
Memory Testing, 1993, records of the 1993 IEEE International Workshop on.
Subjects:
Semiconductor storage devices -- Testing -- Congresses.
Random access memory -- Congresses.
System Details:
Mode of access: World Wide Web.
Notes:
"IEEE catalog number 93TH0554-6"--T.p. verso.
Includes bibliographical references and index.
Contributor:
Rajsuman, Rochit.
IEEE Xplore (Online service)
IEEE Computer Society. Test Technology Technical Committee.
ISBN:
0818641509 (paper)
9780818641503 (paper)
0818641517(microfiche)
OCLC:
30362647
Access Restriction:
Restricted for use by site license.