Records of the 1993 IEEE International Workshop on Memory Testing, August 9-10, 1993, San Jose, California [electronic resource]. edited by R. Rajsuman ; sponsored by IEEE Computer Society, Technical Committee on Test Technology.
- Publication:
- Los Alamitos, Calif. : IEEE Computer Society Press, c1993.
- Format/Description:
- Conference/Event
Book
ix, 143 p. : ill. - Conference Name:
- IEEE International Workshop on Memory Testing (1993 : San Jose, Calif.)
- Online:
- Connect to full text
http://hdl.library.upenn.edu/1017.12/393708 - Status/Location:
-
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Details
- Other Title:
- Memory Testing, 1993, records of the 1993 IEEE International Workshop on.
- Subjects:
- Semiconductor storage devices -- Testing -- Congresses.
Random access memory -- Congresses. - System Details:
- Mode of access: World Wide Web.
- Notes:
- "IEEE catalog number 93TH0554-6"--T.p. verso.
Includes bibliographical references and index. - Contributor:
- Rajsuman, Rochit.
IEEE Xplore (Online service)
IEEE Computer Society. Test Technology Technical Committee. - ISBN:
- 0818641509 (paper)
9780818641503 (paper)
0818641517(microfiche) - OCLC:
- 30362647
- Access Restriction:
- Restricted for use by site license.