Franklin

ICMTS 94 [electronic resource]. proceedings of the 1994 International Conference on Microelectronic Test Structures: March 22-25, 1994, San Diego California / sponsored by the IEEE Electron Devices Society.

Other Title:
Microelectronic test structures
Microelectronic Test Structures, 1994, ICMTS 1994, proceedings of the 1994 International Conference on.
Publication:
[New York] : Institute of Electrical and Electronics Engineers ; Piscataway, NJ : IEEE Service Center [distributor], c1994.
Conference Name:
IEEE International Conference on Microelectronic Test Structures (1994 : San Diego, Calif.)
Format/Description:
Conference/Event
Book
xi, 224 p. : ill.
Subjects:
Integrated circuits -- Testing -- Congresses.
Semiconductors -- Testing -- Congresses.
Transistors -- Testing -- Congresses.
System Details:
Mode of access: World Wide Web.
Notes:
"94CH3380-3."
Includes bibliographical references and index.
Contributor:
IEEE Xplore (Online service)
IEEE Electron Devices Society.
ISBN:
0780317572 (softbound)
9780780317574 (softbound)
0780317580 (casebound)
9780780317581 (casebound)
0780317599 (microfiche)
9780780317598 (microfiche)
OCLC:
30636300
Access Restriction:
Restricted for use by site license.
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