Franklin
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940318s1994 nyua sb 101 0 eng d
001
9945816703503681
020
a| 0780317572 (softbound)
020
a| 9780780317574 (softbound)
020
a| 0780317580 (casebound)
020
a| 9780780317581 (casebound)
020
a| 0780317599 (microfiche)
020
a| 9780780317598 (microfiche)
035
a| (OCoLC)IEEEocm30636300
035
a| (OCoLC)ELECocm30636300
035
a| 4581670
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a| (PU)4581670-penndb-Voyager
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a| OWpT
c| DLC
d| OCL
d| E9X
d| OCLCQ
d| BAKER
d| BTCTA
042
a| lccopycat
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a| PAUU
050
0
4
a| TK7874
b| .I3233 1994
082
0
0
a| 621.3815/48
2| 20
111
2
a| IEEE International Conference on Microelectronic Test Structures
d| (1994 :
c| San Diego, Calif.)
245
1
0
a| ICMTS 94
h| [electronic resource].
b| proceedings of the 1994 International Conference on Microelectronic Test Structures: March 22-25, 1994, San Diego California /
c| sponsored by the IEEE Electron Devices Society.
246
3
0
a| Microelectronic test structures
260
a| [New York] :
b| Institute of Electrical and Electronics Engineers ;
a| Piscataway, NJ :
b| IEEE Service Center [distributor],
c| c1994.
300
a| xi, 224 p. :
b| ill.
538
a| Mode of access: World Wide Web.
500
a| "94CH3380-3."
504
a| Includes bibliographical references and index.
506
a| Restricted for use by site license.
530
a| Also available in print.
650
0
a| Integrated circuits
x| Testing
v| Congresses.
650
0
a| Semiconductors
x| Testing
v| Congresses.
650
0
a| Transistors
x| Testing
v| Congresses.
710
2
a| IEEE Xplore (Online service)
710
2
a| IEEE Electron Devices Society.
740
0
a| Microelectronic Test Structures, 1994, ICMTS 1994, proceedings of the 1994 International Conference on.
856
4
0
u| http://hdl.library.upenn.edu/1017.12/393744
z| Connect to full text