Franklin

Colloquium on "Sub-Micron VLSI Reliability" [electronic resource]. on Wednesday, 8 January 1992 / organised by Professional Group E3 (Microelectronics and Semiconductor Devices).

Other Title:
Electronics Division Colloquium on "Sub-Micron VLSI Reliability"
Sub-Micron VLSI Reliability, IEE Colloquium on.
Publication:
London : Institution of Electrical Engineers, 1992.
Conference Name:
Colloquium on "Sub-Micron VLSI Reliability" (1992 : London, England)
Series:
Colloquium (Institution of Electrical Engineers) ; digest no. 1992/002.
IEE colloquium ; digest no. 1992/002
Format/Description:
Conference/Event
Book
1 v. (various pagings)
Subjects:
Integrated circuits -- Very large scale integration -- Reliability -- Congresses.
Metal oxide semiconductor field-effect transistors -- Congresses.
System Details:
Mode of access: World Wide Web.
Notes:
At head of title: Electronics Division.
Cover title.
Contributor:
IEEE Xplore (Online service)
Institution of Electrical Engineers. Professional Group E3 (Microelectronics and Semiconductor Devices)
Institution of Electrical Engineers. Electronics Division.
OCLC:
35531793
Access Restriction:
Restricted for use by site license.
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