Franklin

Structure-property relationships of oxide surfaces and interfaces II [electronic resource] / editors, Kathleen B. Alexander ... [et al.].

Publication:
Warrendale, Pa. : Materials Research Society, c2003.
Series:
MRS proceedings ; v. 751
MRS proceedings ; v. 751
Format/Description:
Book
ix, 222 p. : digital, PDF fil
Subjects:
Oxides -- Surfaces -- Congresses.
Interfaces (Physical sciences) -- Congresses.
System Details:
Mode of access: World Wide Web.
Contents:
Chemical Structure of N Atoms Incorporated Into 1 nm-Thick SiO2/Si as Revealed With the Dissolution and Hydrogenation in Hydrofluoric Acid
Adsorption of Water Molecules on the Surface of Photo-Catalyst: A First Principles Theoretical Comparison Between InVO4 and Rutile TiO2
The Effect of the Surface Layer on the Dielectric Constant of (Pb, La)TiO3 Thin Films
Direct Determination of the Stacking Order in Gd2O3 Epi-Layers on GaAs
Grain Boundary Segregation in Titanium Dioxide: Evaluation of Relative Driving Forces for Segregation
Electrochemical Properties of Copper Oxide Surfaces, Buried Interfaces, and Subsurface Zones and Their Use to Characterize These Entities
TEM Investigation of the Core/Cladding Interface of La2O3-Al2O3-SiO2 Glasses for High Power Fiber Lasers
Effects of the Amorphous Oxide Intergranular Layer Structure and Bonding on the Fracture Toughness of a High Purity Silicon Nitride
Molecular Dynamics Computer Simulations of Calcium-Alumino-Silicate Intergranular Films Between the Basal and Prism Planes of a-Al2O3
Ab-Initio Theory of Grain-Boundary Segregation in alpha-Alumina: Energetics, Atomistic and Electronic Structures
Simulating Oxide Interfaces and Heterointerfaces
Orientation Dependence of Photochemical Reduction Reactions on SrTiO3 Surfaces
Chromium and Lanthanum on Transition Alumina Surfaces: The Role of Bulk Point-Defect Distributions on Catalytic Activity
Characterization of Porous Pt/Al2O3 Films Produced by Hybrid Gas-to-Particle Conversion and Chemical Vapor Deposition
Low Temperature Growth of Silicon Dioxide Thin Films by UV Photo-Oxidation
Correlation Between Microstructure, DC Resistivity and Magnetoresistance of SrRuO3 Films
The Properties of a Na-Doped Twist Boundary in SrTiO3 From First Principles
The Effect of Y on the Strength of FeCrAl Alloy/Sapphire Interfaces
Interface Conduction Between Conductive ReO3 Thin Film and NdBa2Cu3O6 Thin Film
Effect of Lanthanum Manganite Modification by Calcium and/or Fluorine on the Bonding Strength, Mobility and Reactivity of The Lattice and Surface Oxygen
HRTEM Study of the Extended Defect Structure in Epitaxial Ba0.3Sr0.7TiO3 Thin Films Grown on (001) LaAlO3
Study of Pore Architecture in Silicon Oxide Thin Films by Variable-Energy Positron Annihilation Spectroscopy
The Effect of Changing Epitaxial Strain on Colossal Magnetoresistance Thin Films
Stabilization of Indium Tin Oxide Films to Very High Temperatures
Surface Chemistry of Mesoporous Materials: Effect of Nanopore Confinement
Metalorganic Chemical Vapor Deposition of Aluminum Oxide on Silicon Nitride
Influence of Structure and Chemistry on Piezoelectric Properties of PZT in a MEMS Power Generation Application
Observations of TiO2 Surfaces Using Totally Reflected X-ray In-Plane Diffraction Under UV Irradiation
Phase and Morphology in Mixed CuO-WO3 Films for Chemical Sensing
Surface Electrical Measurements of Photo-Catalysis on Rutile TiO2(110)
Segregation of Yttrium Ions as {2Y'[subscript Zx : V[subscript o}[superscript [delta]] to the Surfaces of t-ZrO2[subscript 2]
Effect of Thin Y-O and Si-O Films on In Situ Formed CaO Coatings on V-4%Cr-4%Ti in Liquid 2.8 at.% Ca-Li
Oxide Structures Formed on Silver Single Crystals due to Hyperthermal Atomic Oxygen Exposure
A Structural Comparison of Si(100) Oxidized by Atomic and Molecular Oxygen.
Notes:
Title from home page (viewed Apr. 15, 2008).
"Published proceedings articles from Symposium Z from the 2002 MRS Fall Meeting."
Issued as part of the MRS online proceedings library.
Includes bibliographical references and indexes.
Contributor:
Alexander, Kathleen B.
Materials Research Society. Meeting (2002 : Boston, Mass.). Symposium Z.
Other format:
Structure-property relationships of oxide surfaces and interfaces II.
ISBN:
9781558996885
1558996885
OCLC:
163251786
Access Restriction:
Restricted for use by site license.
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