Specimen preparation for transmission electron microscopy of materials III [electronic resource] : symposium held December 5-6, 1991, Boston, Mass., U.S.A. / editors, Ron Anderson, Bryan Tracy, John Bravman.

Pittsburgh : Materials Research Society, c1992.
Materials Research Society symposia proceedings ; 0272-9172 v. 254.
Materials Research Society symposia proceedings
1 online resource (xi, 288 p.) : ill.
Materials -- Microscopy -- Congresses.
Electron microscopy -- Congresses.
System Details:
Mode of access: World Wide Web.
Topographic kinetics and practice of low angle ion beam thinning / Arpad Barna
FIBXTEM : focussed ion beam milling for TEM sample preparation / David P. Basile ... [et al.]
Precision ion polishing system / R. Alani and P.R. Swann
An updated gas source focused ion beam instrument for TEM specimen preparation / R. Alani, J.S. Jones, and P.R. Swann
Advances in ultrasonic disk cutting and precision dimpling / P.E. Fischione ... [et al.]
Advancements in dimpling technique for automatically and repeatably thinning TEM samples to near electron transparency / V.L. Carlino and A. Hidalgo
TEM samples of semiconductors prepared by a small-angle cleavage technique / J.P. McCaffrey
Recent developments in the use of the tripod polisher for TEM specimen preparation / J.P. Benedict, R. Anderson, and S.J. Klepeis
Precision ion milling of layered, multi-element TEM specimens with high specimen preparation spatial resolution / R. Anderson and J. Benedict
Preparation of planview TEM samples of YBa₂Cu₃O₇₋[subscript x] films grown on BaF₂(001) / L. Yang ... [et al.]
Minimization of non-uniform ion-thinning effects in thin film transverse specimens for transmission electron microscopy / F. Shaapur and K.A. Watson
Preparation of cross-sectional TEM samples of Fe-Zn couples / L.A. Giannuzzi ... [et al.]
A high resolution TEM specimen thinning system / R. Clampitt ... [et al.]
Preparation of microindentations in cross-section / J.C. Morris, G.M. Pharr and D.L. Callahan
TEM specimen preparation of TiAl alloy powders produced by plasma rotating electrode process / M. Nishida ... [et al.]
Advanced preparation of hard materials for cross-sectional TEM analysis / K. Ostreicher and C. Sung
Preparation of large area cross-sectional TEM specimen of semiconducting heteroepitaxial materials / M. Tamura and S. Aoki
Preparation of large thin area VLSI TEM specimens by dimpling with a "flatting tool" / H.L. Humiston, B.M. Tracy, and L.A. Dass
The syntheses of nanoscale metal particles produced by the beam induced decomposition of metal hydrides and azides in a transmission electron microscope / P.J. Herley, N.P. Fitzsimons, and W. Jones
Rapid plan view fabrication of semiconductor TEM samples for interface strain and grain size analysis / M.W. Cole and J.R. Flemish
Precision TEM sample preparation using focused ion beam marking strategies / C.E. Sanborn and S.A. Myers
Reduced amorphization of ion-milled silicon cross-section transmission electron microscope samples by dynamic annealing during milling / D. Bahnck and R. Hull
Thickness variations and surface layers in ultramicrotomed sections and their effects on elemental mapping / T. Malis and D. Steele
Application of ultramicrotomy to TEM specimen preparation of particulate inclusion and composite materials / O.O. Popoola ... [et al.]
Shaping particles for ultramicrotomy / C.R. Bradley, N.L. Dietz, and J.K. Bates.
Includes bibliographical references and indexes.
Description based on print version record.
Electronic reproduction. [S.l.] : HathiTrust Digital Library, 2011.
Anderson, R. M. (Ron M.)
Tracy, Bryan.
Bravman, J. C. (John C.)
Materials Research Society. Meeting (1991 : Boston, Mass.). Symposium W.
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Print version: Specimen preparation for transmission electron microscopy of materials III.
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