Franklin

Kelvin probe force microscopy : measuring and compensating electrostatic forces / Sascha Sadewasser, Thilo Glatzel, editors.

Publication:
Heidelberg ; New York : Springer-Verlag Berlin Heidelberg, c2012.
Series:
Springer series in surface sciences; 48.
Springer series in surface sciences
Format/Description:
Book
xiv, 331 p. : ill. (some col.) ; 24 cm.
Subjects:
Atomic force microscopy.
Electrostatics -- Measurement.
Notes:
Includes bibliographical references and index.
Contributor:
Sadewasser, Sascha.
Glatzel, Thilo.
ISBN:
9783642225659
3642225659
OCLC:
741541240
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