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Physical and Failure Analysis of Integrated Circuits (IPFA), 2012 19th IEEE International Symposium on the [electronic resource] : date: 2-6 July 2012.

Publication:
[Piscataway, N.J. : IEEE, 2012]
Format/Description:
Conference/Event
Book
1 online resource (various pagings) : illustrations
Conference Name:
International Symposium on the Physical & Failure Analysis of Integrated Circuits (19th : 2012 : Singapore)
Status/Location:
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Details

Other Title:
2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
Also known as: IPFA 2012
Subjects:
Integrated circuits -- Reliability -- Congresses.
Integrated circuits -- Testing -- Congresses.
Semiconductors -- Failures -- Congresses.
Integrated circuits -- Defects -- Congresses.
Integrated circuits -- Defects.
Integrated circuits -- Reliability.
Integrated circuits -- Testing.
Semiconductors -- Failures.
Form/Genre:
Conference papers and proceedings.
Notes:
Proceedings of a meeting held July 2-6, 2012, in Singapore.
Includes bibliographical references.
Title from HTML contents screen (IEEE Xplore, viewed on Feb. 12, 2013).
Contributor:
IEEE Xplore (Online service)
Institute of Electrical and Electronics Engineers.
ISBN:
9781467309806 (print)
146730980X (print)
OCLC:
817932431
Access Restriction:
Restricted for use by site license.