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001 9964937383503681
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a| (OCoLC)IEEEocn875898824
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a| (OCoLC)IEEE875898824 z| (OCoLC)865456228
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a| (PU)6493738-penndb-Voyager
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a| UWW b| eng e| rda c| UWW d| OCLCO d| OCLCF d| OCLCO d| MYG d| CUS
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a| PAUU
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a| TA401.3
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a| IEEE Conference on Reliability Science for Advanced Materials and Devices n| (1st : d| 2013 : c| Golden, Colo.)
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a| Reliability Science for Advanced Materials and Devices (RSAMD), 2013 IEEE Conference on h| [electronic resource] : b| date 24-25 Feb. 2013.
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i| Title on conference website main page : a| 2013 IEEE Conference on Reliability Science for Advanced Materials and Devices (RSAMD) : b| February 24-25, 2013, Colorado School of Mines, Golden, Colorado USA
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i| Also known as: a| RSAMD 2013
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a| 1st IEEE Conference on Reliability Science for Advanced Materials and Devices (RSAMD)
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a| First IEEE Conference on Reliability Science for Advanced Materials and Devices (RSAMD)
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a| [Piscataway, N.J.] : b| [IEEE], c| [2013]
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a| 1 online resource : b| illustrations
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a| text 2| rdacontent
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a| computer 2| rdamedia
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a| online resource 2| rdacarrier
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a| Includes bibliographical references.
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a| Restricted for use by site license.
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a| Description based on online resource; title from website landing page (IEEE Xplore, viewed Oct. 30, 2013).
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0
a| Integrated circuits x| Reliability v| Congresses.
650
  
0
a| Reliability (Engineering) v| Congresses.
650
  
0
a| Materials v| Congresses.
650
  
7
a| Integrated circuits x| Reliability. 2| fast 0| (OCoLC)fst00975588
650
  
7
a| Materials 2| fast 0| (OCoLC)fst01011772
650
  
7
a| Reliability (Engineering) 2| fast 0| (OCoLC)fst01093646
655
  
7
a| Conference papers and proceedings. 2| fast 0| (OCoLC)fst01423772
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a| IEEE Xplore (Online service)
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a| Institute of Electrical and Electronics Engineers, e| publisher.
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u| http://hdl.library.upenn.edu/1017.12/1404572 z| Connect to full text
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b| web h| -