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2013 International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO) [electronic resource] : August 26- 30, 2013, Suzhou, China : conference proceedings / edited by Albert Sill, Rencheng Liu, Wenjun Li ; organized by Soochow University, China, Changchun University of Science and Technology, China, University of Oldenburg, Germany.

Other Title:
Also known as: 3M-NANO 2013
Available from some providers with title: Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO), 2013 International Conference on
Publication:
Piscataway, NJ : IEEE, [2013?]
Conference Name:
International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (2013 : Suzhou Shi, Jiangsu Sheng, China)
Format/Description:
Conference/Event
Book
1 online resource : illustrations
Subjects:
Nanoscience -- Congresses.
Nanotechnology -- Congresses.
Nanoscience.
Nanotechnology.
Form/Genre:
Conference proceedings.
Notes:
"IEEE Catalog Number: CFP133MN-ART."
Title from title screen (IEEE Xplore, viewed Feb. 27, 2014).
Includes bibliographical references and author index.
Contributor:
Sill, Albert, editor.
Liu, Rencheng, editor.
Li, Wenjun, editor.
IEEE Xplore (Online service)
Universität Oldenburg, organizer.
Changchun ke ji da xue, organizer.
Dong Wu da xue (Taipei, Taiwan), organizer.
Institute of Electrical and Electronics Engineers, publisher.
ISBN:
9781479912131
1479912131
9781479912100
1479912107
OCLC:
875918839
Access Restriction:
Restricted for use by site license.
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