Franklin

Proceedings : Thirteenth IEEE European Test Symposium : ETS 2008, 25-29 May 2008, Verbania, Italy

Author/Creator:
IEEE European Test Symposium Corporate Author
Publication:
[Place of publication not identified] Conference Pub Services 2008
Format/Description:
Conference/Event
Book
Conference Name:
IEEE European Test Symposium
Status/Location:
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Details

Subjects:
Integrated circuits -- Testing -- Congresses.
Language:
English
Notes:
Bibliographic Level Mode of Issuance: Monograph
Contributor:
IEEE Computer Society Content Provider
ISBN:
1-5090-8361-8