Franklin

Proceedings of the ... International Symposium on the Physical & Failure Analysis of Integrated Circuits.

Other Title:
IPFA ... proceedings
International Symposium on the Physical and Failure Analysis of Integrated Circuits
Publication:
Piscataway, N.J. : IEEE Service Center
Conference Name:
International Symposium on the Physical & Failure Analysis of Integrated Circuits.
Format/Description:
Conference/Event
Journal/Periodical
Print began in 1988?
Subjects:
Integrated circuits -- Design and construction -- Congresses.
Integrated circuits -- Testing -- Congresses.
Microelectronics -- Research -- Congresses.
Integrated circuits -- Design and construction.
Integrated circuits -- Testing.
Microelectronics -- Research.
Form/Genre:
Periodicals.
Conference papers and proceedings.
Electronic journals.
Notes:
Conference for <1995> organized by IEEE Singapore Section, co-sponsored by IEEE Electron Devices Society.
Description based on: 5th ('95); title from caption (IEEEexplore website, viewed Jan. 8, 2008).
Latest issue consulted: 15th (2008) (surrogate).
Contributor:
Institute of Electrical and Electronics Engineers.
IEEE Singapore Section.
IEEE Electron Devices Society.
ISSN:
1946-1550
OCLC:
297426552
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