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CIOs at Work [electronic resource] / by Ed Yourdon.

Author/Creator:
Yourdon, Ed. author., Author,
Publication:
Berkeley, CA : Apress : Imprint: Apress, 2011.
Format/Description:
Book
1 online resource (376 p.)
Edition:
1st ed. 2011.
Status/Location:
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Subjects:
Business.
Management science.
Local subjects:
Business and Management, general. (search)
Language:
English
System Details:
text file
Summary:
In CIOs at Work, noted author Ed Yourdon interviews many of the world's most influential chief information officers. You will gain insights from the first CIO of the USA, take a peek into the future with the CIO at Google, learn the unique role IT plays in testing Microsoft applications, and much more. Yourdon focuses on how his interviewees tackle the day-to-day work of managing information in their organizations while revealing much more: How they got there, how they manage and allocate resources, and how they interact with business units and assure that their companies take advantage of technologies and automation to make employees even more productive. Surveying a variety of unique corporations, you'll get a great sense of what can be done and what is being done now in organizations around the world. "Simply put, Ed Yourdon's CIOs at Work is a fascinating read. The author has managed to illuminate the real challenges confronting the Chief Information Officer. The technical expertise of his extraordinary interviewees and their personal insights into the changing role of technology in business are in no short supply. But, what really stands out— beyond the banter about "clouds," "agile development,"—is the human dimension. More than anything else, the CIO is wrestling with profound issues: the proliferation of choices, the speed of change, the shorter attention spans of consumers, the "everyone's an expert" mindset, and the growing expectation for limitless and low cost computing resources that are as open and accessible as they are safe, secure and accurate. At last, the CIO has a human face, but also an enormous burden that can only be appreciated by reading Yourdon's probative interviews." —Jon Toigo, Managing Principle, Toigo Partners International Featured CIOs: Ben Fried, Google Tony Scott, Microsoft Monte Ford, American Airlines Mittu Sridhara, Ladbrokes Steve Rubinow, NYSE Lew Temares (retired), University of Miami Mark Mooney, McGraw-Hill Dan Wakeman, Educational Testing Services Lynne Ellen, Detroit Energy Becky Blalock, Southern Company Ken Bohlen, Arizona Public Services Roger Gurnani, Verizon Ashish Gupta, British Telecom Joan Miller, U.K. Parliament Vivek Kundra, (first CIO), U.S. Government Paul Strassmann, (retired), Kraft Foods Other books in the Apress At Work Series:  CTOs at Work, Donaldson, Seigel, & Donaldson, 978-1-4302-3593-4 Coders at Work, Seibel, 978-1-4302-1948-4 Venture Capitalists at Work, Shah & Shah, 978-1-4302-3837-9 Founders at Work, Livingston,  978-1-4302-1078-8 European Founders at Work, Santos, 978-1-4302-3906-2 Women Leaders at Work, Ghaffari, 978-1-4302-3729-7 Advertisers at Work, Tuten, 978-1-4302-3828-7 Gamers at Work, Ramsay. 978-1-4302-3351-0.
Contents:
Preliminary; Benjamin FriedCIO, Google Inc.; Tony ScottCIO, Microsoft; Monte FordSenior Vice President and CIO, American Airlines, Inc./AMR Corporation; Mittu SridharaCIO, Ladbrokes plc; Steve RubinowExecutive Vice President and CIO, NYSE Euronext; Lewis TemaresCIO Emeritus, University of Miami; Mark MooneySenior Vice President and CIO, McGraw-Hill Education; Dan WakemanVice President and CIO, Educational Testing Services; Lynne EllynSenior Vice President and CIO, DTE Energy; Becky BlalockSenior Vice President and CIO, Southern Company, Atlanta
Ken BohlenVice President and CIO, Arizona Public Service Company (APS)Roger GurnaniExecutive Vice President and CIO, Verizon; Ashish GuptaManaging Director of Service Design, British Telecom (BT); Joan MillerDirector of ICT, the UK Parliament; Vivek KundraFirst CIO of the United States of America; Paul StrassmannFormer CIO for Kraft Foods Inc., Xerox Corp., U.S. Department of Defense, and NASA; Back matter
Notes:
Includes index.
ISBN:
1-4302-3555-1
Publisher Number:
10.1007/978-1-4302-3555-2 doi