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VLSI Design and Test [electronic resource] : 22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018, Revised Selected Papers / edited by S. Rajaram, N.B. Balamurugan, D. Gracia Nirmala Rani, Virendra Singh.

Publication:
Singapore : Springer Singapore : Imprint: Springer, 2019.
Format/Description:
Book
1 online resource (XVIII, 722 pages) : 711 illustrations, 324 illustrations in color.
Edition:
1st ed. 2019.
Series:
Computer Science (Springer-11645)
Communications in computer and information science 1865-0929 ; 892
Communications in Computer and Information Science, 1865-0929 ; 892
Contained In:
Springer eBooks
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Subjects:
Computer hardware.
Local subjects:
Computer Hardware. (search)
System Details:
text file PDF
Summary:
This book constitutes the refereed proceedings of the 22st International Symposium on VLSI Design and Test, VDAT 2018, held in Madurai, India, in June 2018. The 39 full papers and 11 short papers presented together with 8 poster papers were carefully reviewed and selected from 231 submissions. The papers are organized in topical sections named: digital design; analog and mixed signal design; hardware security; micro bio-fluidics; VLSI testing; analog circuits and devices; network-on-chip; memory; quantum computing and NoC; sensors and interfaces.
Contents:
Digital design
Analog and mixed signal design
Hardware security
Micro bio-fluidics
VLSI testing
Analog circuits and devices
Network-on-chip
Memory
Quantum computing and NoC
Sensors and interfaces.
Contributor:
Rajaram, S. editor., Editor,
Balamurugan, N.B. editor., Editor,
Gracia Nirmala Rani, D. editor., Editor,
Singh, Virendra, editor., Editor,
SpringerLink (Online service)
Other format:
Printed edition:
Printed edition:
ISBN:
978-981-13-5950-7
9789811359507
9789811359491 (Printed edition)
9789811359514 (Printed edition)
Publisher Number:
10.1007/978-981-13-5950-7 doi
Access Restriction:
Restricted for use by site license.