Franklin

... IEEE metrology for aerospace.

Publication:
Piscataway, NJ : IEEE, 2014-
Conference Name:
IEEE International Workshop on Metrology for Aerospace.
Format/Description:
Conference/Event
Journal/Periodical
Subjects:
Aeronautics -- Congresses.
Metrology -- Congresses.
Aeronautics.
Metrology.
Form/Genre:
Periodicals.
Electronic journals.
Conference papers and proceedings.
Notes:
Description based on: 2014; title from PDF front cover (IEEE Xplore, viewed Dec. 8, 2014).
Contributor:
Institute of Electrical and Electronics Engineers, publisher.
ISSN:
2575-7490
OCLC:
899130981
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