Franklin

Machine vision applications in industrial inspection IX : 22-23 January 2001, San Jose, [California] USA

Publication:
[Place of publication not identified] SPIE 2001
Series:
SPIE proceedings series Machine vision applications in industrial inspection IX
Format/Description:
Book
Subjects:
Engineering inspection -- Automation -- Congresses
Computer vision -- Industrial applications -- Congresses
Quality control -- Automation -- Optical methods -- Congresses
Measurement -- Congresses
Language:
English
Notes:
Bibliographic Level Mode of Issuance: Monograph
Contributor:
Hunt, Martin A Contributor
Society of Photo Optical Instrumentation Engineers Content Provider
Society of Photo-optical Instrumentation Engineers Content Provider
IS & T the Society for Imaging Science and Technology Content Provider
IS & T--the Society for Imaging Science and Technology Content Provider
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