Machine vision applications in industrial inspection IX : 22-23 January 2001, San Jose, [California] USA

Publication:

[Place of publication not identified] SPIE 2001

Series:

SPIE proceedings series Machine vision applications in industrial inspection IX

Format/Description:

Book

Subjects:

Engineering inspection -- Automation -- Congresses
Computer vision -- Industrial applications -- Congresses
Quality control -- Automation -- Optical methods -- Congresses
Measurement -- Congresses

Language:

English

Notes:

Bibliographic Level Mode of Issuance: Monograph

Contributor:

Hunt, Martin A Contributor
Society of Photo Optical Instrumentation Engineers Content Provider
Society of Photo-optical Instrumentation Engineers Content Provider
IS & T the Society for Imaging Science and Technology Content Provider
IS & T--the Society for Imaging Science and Technology Content Provider

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