Franklin

2009 International Conference on Optical Instruments and Technology : optoelectronic measurement technology and systems : 19-22 October 2009, Shanghai, China

Author/Creator:
International Conference on Optical Instruments and Technology Corporate Author
Other Title:
Optoelectronic measurement technology and systems
Publication:
[Place of publication not identified] SPIE 2009
Conference Name:
International Conference on Optical Instruments and Technology
Series:
Proceedings of SPIE 2009 International Conference on Optical Instruments and Technology
Format/Description:
Conference/Event
Book
Subjects:
Optical measurements -- Industrial applications -- Congresses
Optoelectronic devices -- Congresses
Optical instruments -- Congresses
Language:
English
Notes:
Bibliographic Level Mode of Issuance: Monograph
Contributor:
Ye, Shenghua Contributor
Ni, Jun Contributor
Zhang, Guangjun Contributor
SPIE (Society) Content Provider
ISBN:
0-8194-7897-0
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