Franklin

Scanning microscopy 2009 : 4-7 May 2009, Monterey, California, United States

Publication:
[Place of publication not identified] SPIE 2009
Format/Description:
Book
Series:
Proceedings of SPIE Scanning microscopy 2009
Status/Location:
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Details

Subjects:
Scanning electron microscopes -- Congresses.
Language:
English
Notes:
Bibliographic Level Mode of Issuance: Monograph
Contributor:
Postek, Michael T Contributor
National Institute of Standards and Technology (U.S.) Content Provider
SPIE (Society) Content Provider