Franklin

Optically based methods for process analysis : 22-27 March 1992, Somerset, New Jersey, United States / editor, David S. Bomse [and seven others] ; sponsored by SPIE.

Publication:
Bellingham, Washington : SPIE, 1992.
Format/Description:
Book
1 online resource (384 pages).
Series:
Proceedings of SPIE--the International Society for Optical Engineering ; Volume 1681.
Proceedings of SPIE ; Volume 1681
Status/Location:
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Details

Subjects:
Chemical process control -- Congresses.
Quality control -- Optical methods -- Congresses.
Spectrum analysis -- Congresses.
Form/Genre:
Electronic books.
Notes:
Description based on: online resource; title from title screen (SPIE Digital Library, viewed December 1, 2018).
Contributor:
Bomse, David S., editor.
Society of Photo-optical Instrumentation Engineers, sponsoring body.