Franklin

Optical testing and metrology II : 27-30 June 1988, Dearborn, Michigan

Publication:
[Place of publication not identified] SPIE 1989
Format/Description:
Book
Series:
Proceedings of SPIE--the International Society for Optical Engineering Optical testing and metrology II
Status/Location:
Loading...

Options
Location Notes Your Loan Policy

Details

Subjects:
Measurement -- Congresses.
Optical measurements -- Congresses.
Language:
English
Notes:
Bibliographic Level Mode of Issuance: Monograph
Contributor:
Grover, C. P Contributor
Society of Photo Optical Instrumentation Engineers Content Provider
Society of Photo-optical Instrumentation Engineers Content Provider
Engineering Society of Detroit Content Provider