Franklin

Automated inspection and high speed vision architectures II : 10-11 November, 1988, Cambridge, Massachusetts

Publication:
[Place of publication not identified] SPIE 1989
Series:
SPIE proceedings series Automated inspection and high speed vision architectures II
Format/Description:
Book
Subjects:
Quality control -- Automation -- Congresses -- Optical methods.
Computer vision -- Congresses.
Language:
English
Notes:
Bibliographic Level Mode of Issuance: Monograph
Contributor:
Chen, Michael J. W Contributor
Carnegie-Mellon University Center for Optical Data Processing. Content Provider
Carnegie Mellon University Content Provider
Society of Photo-optical Instrumentation Engineers Content Provider
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