Franklin

Machine vision applications in industrial inspection IV : Electronic Imaging Science and Technology : 28 January-2 February 1996, San Jose, CA, United States / editors, A. Ravishankar Rao, Ning Chang ; sponsored by SPIE.

Publication:
Bellingham, Washington : SPIE, 1996.
Conference Name:
Electronic Imaging Science and Technology Symposium (1996 : San Jose, Calif.)
Series:
Proceedings of SPIE--the International Society for Optical Engineering ; Volume 2665.
Proceedings of SPIE ; Volume 2665
Format/Description:
Conference/Event
Book
1 online resource (vii, 284 pages).
Subjects:
Engineering inspection -- Automation -- Congresses.
Computer vision -- Industrial applications -- Congresses.
Form/Genre:
Electronic books.
Notes:
Description based on: online resource; title from title screen (SPIE Digital Library, viewed November 17, 2018).
Contributor:
Ravishankar Rao, A., editor.
Chang, Ning-San, editor.
Society of Photo-optical Instrumentation Engineers, sponsoring body.
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