Noise and information in nanoelectronics, sensors, and standards : 2-4 June 2003, Santa Fe, New Mexico, USA

Publication:

[Place of publication not identified] SPIE 2003

Series:

SPIE proceedings series Noise and information in nanoelectronics, sensors, and standards

Format/Description:

Book

Subjects:

Electronic noise -- Standards -- Congresses.
Electronic noise -- Congresses.
Quantum electronics -- Congresses.
Nanotechnology -- Congresses.
Information technology -- Congresses.
Detectors -- Congresses.

Language:

English

Notes:

Bibliographic Level Mode of Issuance: Monograph

Contributor:

Kish, Laszlo B Contributor
Society of Photo-optical Instrumentation Engineers Content Provider
Texas A & M University Content Provider
Texas A & M University Department of Electrical Engineering. Content Provider

Loading...