Franklin

Noise and information in nanoelectronics, sensors, and standards : 2-4 June 2003, Santa Fe, New Mexico, USA

Publication:
[Place of publication not identified] SPIE 2003
Series:
SPIE proceedings series Noise and information in nanoelectronics, sensors, and standards
Format/Description:
Book
Subjects:
Electronic noise -- Standards -- Congresses.
Electronic noise -- Congresses.
Quantum electronics -- Congresses.
Nanotechnology -- Congresses.
Information technology -- Congresses.
Detectors -- Congresses.
Language:
English
Notes:
Bibliographic Level Mode of Issuance: Monograph
Contributor:
Kish, Laszlo B Contributor
Society of Photo-optical Instrumentation Engineers Content Provider
Texas A & M University Content Provider
Texas A & M University Department of Electrical Engineering. Content Provider
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