Surface scattering and diffraction III : 4-6 August, 2003, San Diego, California, USA

Publication:

[Place of publication not identified] SPIE 2003

Series:

SPIE proceedings series Surface scattering and diffraction III

Format/Description:

Book

Subjects:

Surface roughness -- Measurement -- Congresses
Diffractive scattering -- Congresses
Optical measurements -- Congresses
Scattering (Physics) -- Congresses
Metrology -- Congresses

Language:

English

Notes:

Bibliographic Level Mode of Issuance: Monograph

Contributor:

Maradudin, Alexei A Contributor
Gu, Zu-Han. Contributor
Gu, Zu-Han Contributor
Society of Photo-optical Instrumentation Engineers Content Provider
Society of Photo Optical Instrumentation Engineers Content Provider

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