Franklin

Two- and three-dimensional vision systems for inspection, control, and metrology : 29-30 October 2003, Providence, Rhode Island, USA

Publication:
[Place of publication not identified] SPIE 2004
Series:
SPIE proceedings series Two- and three-dimensional vision systems for inspection, control, and metrology
Format/Description:
Book
Subjects:
Computer vision -- Optical methods -- Congresses
Imaging systems -- Congresses
Three-dimensional display systems -- Congresses
Optical pattern recognition systems -- Congresses
Quality control -- Congresses
Optical measurements -- Congresses
Metrology -- Congresses
Language:
English
Notes:
Bibliographic Level Mode of Issuance: Monograph
Contributor:
Batchelor, Bruce G Contributor
Hèugli, Heinz. Contributor
Hügli, Heinz Contributor
Society of Photo Optical Instrumentation Engineers Content Provider
Society of Photo-optical Instrumentation Engineers Content Provider
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