Imaging and illumination for metrology and inspection : 2-4 November 1994, Boston, Massachusetts

Publication:

[Place of publication not identified] SPIE 1995

Series:

Proceedings / SPIE--the International Society for Optical Engineering Imaging and illumination for metrology and inspection

Format/Description:

Book

Subjects:

Computer vision -- Congresses.
Optical detectors -- Congresses.
Interferometry -- Congresses.
Three-dimensional imaging -- Congresses.

Language:

English

Notes:

Bibliographic Level Mode of Issuance: Monograph

Contributor:

Svetkoff, Donald J Contributor
Society of Photo Optical Instrumentation Engineers Content Provider
Society of Photo-optical Instrumentation Engineers Content Provider

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