Franklin

Imaging and illumination for metrology and inspection : 2-4 November 1994, Boston, Massachusetts

Publication:
[Place of publication not identified] SPIE 1995
Series:
Proceedings / SPIE--the International Society for Optical Engineering Imaging and illumination for metrology and inspection
Format/Description:
Book
Subjects:
Computer vision -- Congresses.
Optical detectors -- Congresses.
Interferometry -- Congresses.
Three-dimensional imaging -- Congresses.
Language:
English
Notes:
Bibliographic Level Mode of Issuance: Monograph
Contributor:
Svetkoff, Donald J Contributor
Society of Photo Optical Instrumentation Engineers Content Provider
Society of Photo-optical Instrumentation Engineers Content Provider
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