2nd European Congress on Optics Applied to Metrology (METROP) : presented as part of the Optics, Photonics, and Iconics Engineering Meeting (OPIEM), November 26-30, 1979, Strasbourg, France
- [Place of publication not identified] Society of Photo optical Instrumentation Engineers 1980
- Conference Name:
- European Congress on Optics Applied to Metrology
- Proceedings of the Society of Photo-optical Instrumentation Engineers ; v. 210 2nd European Congress on Optics Applied to Metrology (METROP)
- Optical measurements -- Congresses.
Holographic interferometry -- Congresses.
Speckle metrology -- Congresses.
- Bibliographic Level Mode of Issuance: Monograph
- Grosmann, Michel Contributor
Meyrueis, Patrick Contributor
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