Franklin

2nd European Congress on Optics Applied to Metrology (METROP) : presented as part of the Optics, Photonics, and Iconics Engineering Meeting (OPIEM), November 26-30, 1979, Strasbourg, France

Author/Creator:
European Congress on Optics Applied to Metrology Corporate Author
Publication:
[Place of publication not identified] Society of Photo optical Instrumentation Engineers 1980
Conference Name:
European Congress on Optics Applied to Metrology
Series:
Proceedings of the Society of Photo-optical Instrumentation Engineers ; v. 210 2nd European Congress on Optics Applied to Metrology (METROP)
Format/Description:
Conference/Event
Book
Subjects:
Optical measurements -- Congresses.
Holographic interferometry -- Congresses.
Speckle metrology -- Congresses.
Language:
English
Notes:
Bibliographic Level Mode of Issuance: Monograph
Contributor:
Grosmann, Michel Contributor
Meyrueis, Patrick Contributor
Society of Photo Optical Instrumentation Engineers Content Provider
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