Franklin

Structural reliability of yttria-doped, hot-pressed silicon nitride at elevated temperatures / S. M. Widerhorn; N. J. Tighe.

Author/Creator:
Widerhorn, S. M., author
Publication:
Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 1983.
Series:
NBSIR ; 83-2664.
NBSIR ; 83-2664
Format/Description:
Government document
Book
1 online resource.
Notes:
1983.
Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
Title from PDF title page.
Includes bibliographical references.
Contributor:
Tighe, N. J.
Widerhorn, S. M.
United States. National Bureau of Standards.
OCLC:
945070833
Publisher Number:
GOVPUB-C13-610199f2b561af8c01761cd24a2256a5
Access Restriction:
Open Access Unrestricted online access star
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