Franklin

An NMOS test chip for a course in semiconductor parameter measurements / K. P. Roenker; L. W. Linholm.

Author/Creator:
Roenker, K. P. author
Publication:
Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 1984.
Format/Description:
Government document
Book
1 online resource.
Series:
NBSIR ; 84-2822.
NBSIR ; 84-2822
Status/Location:
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Details

Notes:
1984.
Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
Title from PDF title page.
Includes bibliographical references.
Contributor:
Roenker, K. P.
United States. National Bureau of Standards.
OCLC:
945071249
Publisher Number:
GOVPUB-C13-c5167dc64271060a96cd395a10573a95
Access Restriction:
Open Access Unrestricted online access star