Methods of measurement for semiconductor materials, process control, and devices : Quarterly report, October 1 to December 31, 1969 / W. Murray Bullis.
- Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 1970.
- Government document
1 online resource.
- NBS technical note ; 527.
NBS technical note ; 527
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