Methods of measurement for semiconductor materials, process control, and devices : Quarterly report, October 1 to December 31, 1969 / W. Murray Bullis.
- Publication:
- Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 1970.
- Format/Description:
- Government document
Book
1 online resource. - Series:
- NBS technical note ; 527.
NBS technical note ; 527 - Status/Location:
-
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Details
- Notes:
- 1970.
Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
Title from PDF title page.
Includes bibliographical references. - Contributor:
- Bullis, W. Murray.
United States. National Bureau of Standards. - OCLC:
- 936670133
- Publisher Number:
- GOVPUB-C13-749542322752b6f3e8e18f48765b3760
- Access Restriction:
- Open Access Unrestricted online access star