Franklin

Method for measuring axis orthogonality in MEMS accelerometers Craig D. McGray; Yaqub Afridi; Jon Geist.

Author/Creator:
McGray, Craig D, author
Publication:
Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2013.
Series:
NISTIR ; 7925.
NISTIR ; 7925
Format/Description:
Government document
Book
1 online resource (11 pages) : illustrations (some color).
Subjects:
Accelerometers.
Axis orthogonality.
Notes:
"July 2013."
Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
Title from PDF title page (viewed July 16, 2013).
Includes bibliographical references.
Contributor:
Afridi, Yaqub.
Geist, Jon.
McGray, Craig D.
National Institute of Standards and Technology (U.S.). Semiconductor and Dimensional Division, Physical Measurement Laboratory.
OCLC:
852900099
Publisher Number:
GOVPUB-C13-eb3eb13243d6a34414f4dab2e6da389a
Access Restriction:
Open Access Unrestricted online access star
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