Franklin

Cross-Layer Reliability of Computing Systems / Giorgio Di Natale; Dimitris Gizopoulos; Stefano Di Carlo; Alberto Bosio; Ramon Canal [Eds].

Publication:
Stevenage : IET, 2020.
Format/Description:
Book
1 online resource (329 pages)
Series:
Materials, Circuits & Devices.
Materials, Circuits & Devices
Status/Location:
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Details

Subjects:
Computer architecture.
Stochastic processes.
Summary:
The book deals with the following subjects: cross-layer reliability of computing systems; design techniques to improve the resilience of computing systems; technological layer; logic layer; architectural layer; software layer; cross-layer resilience; physical stress; soft error modeling and simulation; microarchitecture-level reliability assessment of multi-core processors; fault injection at the instruction set architecture (ISA) level; analytical modeling; and stochastic methods.
Contributor:
Di Natale, Giorgio, ed.
Gizopoulos, Dimitris, ed.
Di Carlo, Stefano, ed.
Bosio, Alberto, ed.
Canal, Ramon, ed.
ISBN:
9781785617980
Publisher Number:
10.1049/PBCS057E doi
Access Restriction:
Restricted for use by site license.