Franklin

Annual proceedings, reliability physics.

Other Title:
Reliability physics
Publication:
New York : Institute of Electrical and Electronics Engineers, c1974-1993.
Conference Name:
International Reliability Physics Symposium.
Format/Description:
Conference/Event
Journal/Periodical
20 v. : ill. ; 28 cm.
12th (1974)-31st (1993).
Continues:
Reliability Physics Symposium. Annual proceedings, reliability physics
Continued By:
International Reliability Physics Symposium. IEEE international reliability physics proceedings
Subjects:
Semiconductors -- Reliability -- Congresses.
Reliability (Engineering) -- Congresses.
Integrated circuits -- Reliability -- Congresses.
Electronics -- Reliability -- Congresses.
Notes:
Sponsored by: the IEEE Electron Devices Group and the IEEE Reliability Group, 1974-1975; by the IEEE Electron Devices Society and the IEEE Reliability Group, 1976-1978; by the IEEE Electron Devices Society and the IEEE Reliability Society, 1979-1993.
Contributor:
Institute of Electrical and Electronics Engineers. Electron Devices Group.
IEEE Reliability Group.
IEEE Electron Devices Society.
IEEE Reliability Society.
OCLC:
186661658
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