Franklin

Atom-probe field ion microscopy and its applications / Toshio Sakurai, A. Sakai, H.W. Pickering.

Author/Creator:
Sakurai, Toshio.
Publication:
Boston : Academic Press, c1989.
Format/Description:
Book
vii, 299 p. : ill. ; 24 cm.
Series:
Advances in electronics and electron physics. Supplement. 20
Status/Location:
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Details

Subjects:
Field ion microscope.
Notes:
Includes indexes.
Bibliography: p. 275-292.
Contributor:
Sakai, A.
Pickering, H. W.
ISBN:
0120145820
OCLC:
182872982