Franklin

Proceedings of the ... International Conference on Microelectronic Test Structures / IEEE International Conference on Microelectronic Test Structures.

Other Title:
Vols. for <1996-> have title: Proceedings
ICMTS
Publication:
New York, N.Y. : Institute of Electrical and Electronics Engineers, 1989-
Conference Name:
IEEE International Conference on Microelectronic Test Structures.
Format/Description:
Conference/Event
Journal/Periodical
v. : ill. ; 30 cm.
Annual
1989-
Continues:
IEEE International Conference on Microelectronic Test Structures. Proceedings of the ... IEEE International Conference on Microelectronic Test Structures
Subjects:
Integrated circuits -- Testing -- Congresses.
Notes:
Latest issue consulted: 1992.
Vols. for 1989 sponsored by the IEEE Electron Devices Society in cooperation with the IEE; for 1990-<1992> by the Society.
Contributor:
IEEE Electron Devices Society.
Institution of Electrical Engineers.
ISSN:
1071-9032
OCLC:
20480732
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